We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Surface Inspection Equipment.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

Surface Inspection Equipment Product List and Ranking from 13 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Dec 17, 2025~Jan 13, 2026
This ranking is based on the number of page views on our site.

Surface Inspection Equipment Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Dec 17, 2025~Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. 朝日測器 Osaka//Industrial Electrical Equipment
  2. トリコ 東京支店 Tokyo//Industrial Electrical Equipment
  3. null/null
  4. 4 ブルーオーシャンテクノロジー Tokyo//Industrial Machinery
  5. 5 ジャステム Niigata//Industrial Machinery

Surface Inspection Equipment Product ranking

Last Updated: Aggregation Period:Dec 17, 2025~Jan 13, 2026
This ranking is based on the number of page views on our site.

  1. Surface Inspection Device FRT トリコ 東京支店
  2. Measurement and Surface Inspection Device "Allroundia DV"
  3. Film surface inspection device ブルーオーシャンテクノロジー
  4. Surface inspection device "IMAGE2000.PCWII" 朝日測器
  5. 4 Surface Inspection Device "IMAGE8000.DHV" 朝日測器

Surface Inspection Equipment Product List

1~15 item / All 19 items

Displayed results

Film surface inspection device

It is a compound wafer appearance inspection device for SiC, sapphire, and GaN wafers.

It is effective for inspecting internal micro-pipes, delamination, surface scratches, foreign substances, polishing marks, and more. The inspection system features four optical systems: super macro, differential interference, dark field, and transmission, all equipped with autofocus, allowing inspections to be conducted in the same coordinate system using an automatic stage. Optionally, AFM and wafer thickness measurements can also be added to the same coordinate system. 【Device Applications】 ■ Internal micro-pipes in wafers ■ Internal delamination in wafers ■ Surface scratch inspection, polishing mark inspection ■ Foreign substance inspection (including internal) ■ Measurement of surface roughness and pattern inclination (optional AFM) ■ Inspection of scratches, pits, and bubbles ■ Non-contact thickness measurement (optional thickness gauge) ■ Micro-cracks, pinholes ■ General appearance inspection and more.

  • Visual Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface inspection device "IMAGE2000.PCWII"

A surface inspection device with enhanced high-resolution capabilities for wide sheets and improved adaptability to multiple optical conditions!

The comprehensive inspection device IMAGE2000 has achieved simplification and cost reduction of all functions through the computer network. Inspection signal processing + defect image processing + defect image filing + defect map report function are all integrated into one FA computer! The number of connectable cameras was limited to four with the old PCW, but with PCWII, it can now connect up to six cameras. This has improved the high resolution of wide sheets and the ability to accommodate multiple optical conditions. The speed of defect image acquisition has significantly improved, greatly enhancing the capture of discrete defect images. *For more details, please download the catalog.

  • Image Processing Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface Inspection Device "IMAGE8000.DHV"

Surface inspection device equipped with a high-speed CCD camera with a video rate of 80/160 MHz (1:1 processing support)!

The surface inspection device "IMAGE8000.DHV" is a system equipped with a high-speed CCD camera operating at 80/160MHz (1:1). It uses a fiber optic camera link extender method, allowing connection between the detector (four cameras) and signal processing with a single fiber optic cable (with a maximum cable length of 200m). 【Features】 ■ Camera Link Extender The fiber optic camera link image transfer unit can transmit images from four Base Configuration cameras using a single fiber optic cable. ■ Digital High-Function Calculation ■ Camera signal extension up to 200m ■ Defect Evaluation Parameters ■ Real-Time Display Function ■ Variety Registration ■ Calibration Mode *For more details, please download the catalog or contact us.

  • Image Processing Equipment
  • Other surface treatment equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface Inspection Device "IMAGE8000.DHV"

A surface inspection device with enhanced high-resolution capabilities for wide sheets and improved adaptability to multiple optical conditions!

The IMAGE8000.DHV is a high-speed CCD camera system equipped with an 80/160MHz (1:1) camera. It uses a fiber optic camera link extender method, allowing a single fiber optic cable to connect the detector (four cameras) to the signal processing unit. (The maximum length of the fiber optic cable can be up to 200m.) 【Features】 ○ Surface inspection device for plain sheet-shaped products ○ Up to 12 cameras can be connected to one signal processing unit. ○ Connected cameras can be grouped into multiple configurations (front/back or transmission/reflection, etc.) depending on the equipment configuration and installation conditions. ○ The connection distance between the cameras and the signal processing unit can be extended up to 200m. ○ High-speed/high-resolution digital cameras can be used. ○ The use of high-speed cameras improves the resolution in the flow direction, enabling more precise defect detection. ○ Equipped with gradation comparison processing, point, area, line, and three-line parallel pipeline arithmetic processing, and two-dimensional digital computation functions. ○ Up to six evaluation parameters can be set per camera. ○ Custom specifications, such as marking devices (label markers/pen markers) and slit compatibility, can also be customized. *Please consult us.

  • Image Processing Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Wafer Surface Inspection Machine (VSI-01 Type)

This is a device for surface inspection of wafers after polishing.

- Detects foreign particles of φ0.2μm or larger using a scattered light detection method. - Uses vacuum suction on the backside, ensuring no contact with the wafer surface.

  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface inspection equipment

We will find dirt and scratches on the surface of the sheet!

The surface inspection device is an inspection device that detects stains and dirt on the surface of sheets being transported at high speed. It automatically starts inspection through communication with the main unit, eliminating the possibility of forgetting to start the inspection. Similarly, it automatically switches inspection product information, making data switching tasks unnecessary. It can store defective image data for about three months, and searches can be conducted by date, product type, and time. 【Features】 ■ Automatic inspection start function ■ Automatic inspection product switching function ■ Curvature tracking function ■ NG image data management For more details, please refer to the catalog or feel free to contact us.

  • Visual Inspection Equipment
  • Other inspection equipment and devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface inspection equipment with proven results for super-large workpieces!

Experience with meter-scale objects! We scan with multiple cameras to inspect product defects (dents, bulges, discoloration).

This is a device for automatic inspection of defects (dents, bulges, discoloration) on the surface of metal plates. ◆ Significantly reduces inspection time by replacing visual inspections! ◆ Achieves high efficiency in the process through automation of the inspection process. ◆ Illuminates the workpiece with built-in lighting in the inspection device and detects reflected light with a camera (acquires bright field images) to detect defects and identify their locations through image processing. ◆ The surface shape of detected defects can be measured in detail using a three-dimensional shape measuring device. ◆ Equipped with a vacuum chuck and air blow function for dust removal. ◆ Proven capability to handle super-large workpieces (metal plates measuring 10m in length and 2m in width)!

  • Defect Inspection Equipment
  • Flaw detection testing
  • Visual Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Automated transport-type transparent substrate inspection device

A substrate inspection device that enables high-precision front-and-back separation.

The "Automatic Transport Type Transparent Substrate Inspection Device" is a surface inspection device for glass substrates and sapphire substrates developed by YGK (Yamanashi Technical Workshop). It is a dedicated machine for transparent glass substrates and is also compatible with various types of frosted back substrates. With an automatic sensor focusing mechanism, it enables high-precision front and back separation. The compatible substrate size is up to 200mm x 200mm. If you require sizes larger than 200mm, please consult us. 【Features】 ■ Automatic transport ■ High-precision front and back separation ■ High performance *For more details, please contact us or download the catalog.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Manual Type Transparent Substrate Inspection Device

A substrate foreign matter inspection device that meets needs.

The "Manual Type Transparent Substrate Inspection Device" is a manual glass substrate surface inspection device/sapphire surface inspection device manufactured by YGK (Yamanashi Technical Workshop), designed for workpiece placement. It is compact and inexpensive, capable of measuring foreign substances on silicon wafers and glass substrates, and has made it possible to measure the separation of the front and back sides of glass substrates and detect latent defects on SiC surfaces, which were previously difficult. Additionally, we accept customer samples of silicon wafers/glass substrates and conduct sample measurements using the YPI series. 【Features】 ■ Unprecedented high speed, high precision, and low cost ■ Space-saving ■ Reduced measurement time, etc. *For more details, please contact us or download the catalog.

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Sheet Surface Inspection Device "PIE-650"

Achieve high-speed, high-precision defect detection with four flexible system configurations. It is a surface inspection device with excellent operability.

The "PIE-650" is a sheet surface inspection device that detects defects in continuously running sheet-like (WEB) films, metal foils, steel plates, paper, non-woven fabrics, as well as glass, laminated boards, resins, and food. It achieves and maintains high production efficiency with high-speed and high-resolution defect detection. Additionally, it can flexibly accommodate inspection needs with system configurations ranging from small-scale to large-scale systems. 【Features】 - Capable of detecting fine defects and defects with small differences in shading quickly and accurately - Compatible with 850MHz cameras - Can detect a wide variety of defects - High-speed image processing of 43 camera images across four stages - Excellent operability *For more details, please refer to the PDF document or feel free to contact us.

  • Image Processing Equipment
  • Defect Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Cutting Hole Surface Inspection Device "GyroScan" [Laser Scan Method]

A cutting hole surface inspection device that can perform automatic inspections of cutting hole surfaces astonishingly easily! High precision with high-speed scanning, making it suitable for production sites!

The "Gyro Scan" is a surface inspection device for cutting holes that inserts an inspection probe into a cylinder to check for defects on the inner surface of the cylinder. It employs a laser scanning method that rotates the laser light in the circumferential direction during inspection. It moves with each rotation to inspect the entire inner surface. By using a micro spot laser light for inspection, it boasts excellent resolution. It allows for easy and stable use of high resolution, providing consistent inspection results even with changes in environmental materials. 【Features】 - Automates visual inspection, improving labor efficiency and accuracy of inspections - Inspects with a minimum detection size of φ0.05mm, enhancing production quality - The laser method achieves stability that is applicable in production environments *For more details, please request documentation or view the PDF data available for download.

  • Other inspection equipment and devices
  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface Inspection Device FRT

Surface Measurement Device FRT

The measuring devices from Germany's FRT company are suitable for the analysis of all materials. With a wide variety of sensors and light sources available, it is possible to provide optimal measurements.

  • FRT社パネル案A1.png
  • Visual Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Surface Inspection Device IMAGE2000.DA II

A surface inspection device improved to allow a maximum of 24 connectable cameras!

Surface inspection device equipped with a digital high-performance computing unit, enabling the detection of visually limited defects. ■□■Features■□■ ■ Exhibits inspection capabilities close to visual inspection through surface field inspection and 2D digital computing functions. ■ Developed as a high-precision high-speed inspection system by systematizing advanced technologies such as ultra-fast CCD cameras, dedicated lighting for different inspection items, high-speed digital computing chips, and computers. ■ Equipped with gradation comparison processing, point, image, line, and three-line parallel pipeline computing processing, and 2D digital computing functions. ■ Stable detection is possible with a three-dimensional evaluation method, allowing for simple sorting of defects through three modes of evaluation: density (level) sorting → width sorting → shape sorting. ■ For more details, please download the catalog or contact us.

  • Visual Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Sheet Material Surface Inspection Device

Visual field testing demonstrates inspection capabilities close to visual inspection with 2D digital computation functions!

The "Sheet Material Surface Inspection Device" is a system that enables the detection of visually imperceptible defects through the incorporation of a digital high-performance computing unit. Developed by systematizing cutting-edge technologies such as ultra-fast CCD cameras, dedicated lighting for specific inspection items, high-speed digital processing chips, and computers, it is a high-precision, high-speed inspection system. Additionally, we offer a low-cost model that integrates inspection signal processing, defect image display, filing, and defect mapping functions into an all-in-one FA computer. 【Features】 ■ Enables detection of visually imperceptible defects due to the incorporation of a digital high-performance computing unit ■ Exhibits inspection capabilities close to visual inspection through surface field inspection and 2D digital processing functions ■ Developed by systematizing cutting-edge technologies *For more details, please refer to the external link page or feel free to contact us.

  • Other inspection equipment and devices
  • Defect Inspection Equipment
  • Visual Inspection Equipment

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration